In situ and Analytical Microscopy Research
Professor Thompson's research interest in phase stability and the use of microscopy to quantify this behavior has led to synergistic efforts in metrology sciences. In these efforts, his group looks at means to understand and expand analytical electron microscopy and atom probe tomography quantification.
Cross Correlative Microscopy
The procedure to prepare sample for correlative TEM and APT: (a) The bar with Pt protection on the top and left was cut by Ga+ ions; (b) The bar was lift out by Omniprobe. Si half grid into a hummingbird hold was also shown; (c) pieces of the bar were mounted to the top of Si half grid and milled and cleaned up by Ga+ ions using 30 kV and 5 kV, respectively; (d) The grid holder fitted directly into a hummingbird Tecnai F20 TEM single-tilt holder. Modification of a Cameca puck specimen assembly that allows the insertion of the hummingbird holder into the local electrode atom probe (LEAP) instrument.
(a) TEM image of the Fe 8 at.% Cr atom probe tip (b) PED orientation map of the same atom probe tip (c) CSL boundary line map laid over the image quality map of the tip; (d) Atom map image with grain boundaries delineated by an isodensity surface (e) 2D composition profile map with grain boundary sequences overlaid.
Highlighted Papers:
Dynamical Diffraction
Highlighted Papers:
K.L. Torres, R.R. Vanfleet, and G.B. Thompson “Dynamical diffraction simulations in FePt-I” Microscopy & Microanalysis 17 (2011) 398-402.
K. L. Torres, RR. Vanfleet, and G.B. Thompson “Comparison of simulated and experimental order parameters in FePt – II” Microscopy & Microanalysis 17 (2011) 403-409.
K.L. Torres, M. Danil, M.A. Willard and G.B. Thompson “The influence of voxel size on atom probe tomography data” Ultramicroscopy, 111 (2011) 464-468.
K.L. Torres, B. Geiser, M.P. Moody, S.P. Ringer, and G.B. Thompson “Field Evaporation Behaviour in [001] FePt Thin Films” Ultramicroscopy, 111 (2011) 512-517.
K. L. Torres, RR. Vanfleet, and G.B. Thompson “Comparison of simulated and experimental order parameters in FePt – II” Microscopy & Microanalysis 17 (2011) 403-409.
K.L. Torres, M. Danil, M.A. Willard and G.B. Thompson “The influence of voxel size on atom probe tomography data” Ultramicroscopy, 111 (2011) 464-468.
K.L. Torres, B. Geiser, M.P. Moody, S.P. Ringer, and G.B. Thompson “Field Evaporation Behaviour in [001] FePt Thin Films” Ultramicroscopy, 111 (2011) 512-517.